PhD Vacancy - METROLOGY AND PROCESS INTEGRATION FOR DEFECT MAPPING OF SEMICONDUCTOR MATERIALS

About the Role

This highly innovative PhD project, led by Swansea University and based at NPL in London, aims to create new tools for analysing semiconductor wafers and devices, focusing on the latest materials like compound semiconductors. Compound semiconductors, important in the UK's semiconductor strategy, are used in various technologies like electric vehicles, sensors, and quantum technologies. They are more efficient than traditional silicon, but are sensitive to defects, which can lead to production issues and high costs. The project will develop methods to inspect wafers more effectively, using machine learning to identify critical defects in the latest semiconductor materials like SiC, GaN and β-Ga2O3. These materials offer profound advantages for power devices over silicon technologies. This PhD work is critical as low production yields lead to wastage and slow market growth. The project is funded by an iCASE award to the National Physical Laborato...