Postdocs on ultrafast soft-X-ray metrology and high-harmonic metrology

Two job openings for postdoc positions on ultrafast soft-X-ray metrology, and solid-state high-harmonic super-resolution microscopy at ARCNL, Amsterdam

Work Activities

The High-harmonic generation and EUV science group at ARCNL, Amsterdam, has openings for two positions for postdoctoral researchers (2-year contracts).

Project 1:

You will contribute to some of our ongoing investigations to develop new ultrafast femtosecond to attosecond time-scale semiconductor spectroscopy, imaging and metrology techniques in the soft-X-ray spectral range based on a laboratory-based high-harmonic generation setup. This includes developing soft-X-ray spectroscopic scatterometry to measure nanoscale features of various multilayer semiconductor structures, and develop ultrafast metrology to characterize electrical contacts between different layers in a ...